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Proceedings Paper

New technique to reconstruct effective 3D profile from tilt images of CD-SEM
Author(s): Hidetoshi Morokuma; Atsushi Miyamoto; Maki Tanaka; Masato Kazui; Atsushi Takane
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Paper Abstract

This study presents a new and unique method to reconstruct 3D profile from tilt images of SEM for semiconductor device pattern called 'Inverse Stereo Matching'. This method is based on 'the shape from shading' and it’s more stable than the conventional stereo matching method in case of low S/N in sidewall of tilt images, and it is able to reconstruct gradual change of sidewall shape that is difficult for the conventional stereo matching to reconstruct in detail. Additionally, this study presents a new method using 'MPPC Indices' to compensate errors of local shape in reconstruction 3D profile caused by the particular characteristic of secondary electron.

Paper Details

Date Published: 24 May 2004
PDF: 8 pages
Proc. SPIE 5375, Metrology, Inspection, and Process Control for Microlithography XVIII, (24 May 2004); doi: 10.1117/12.536445
Show Author Affiliations
Hidetoshi Morokuma, Hitachi High-Technologies Corp. (Japan)
Atsushi Miyamoto, Hitachi, Ltd. (Japan)
Maki Tanaka, Hitachi, Ltd. (Japan)
Masato Kazui, Hitachi, Ltd. (Japan)
Atsushi Takane, Hitachi High-Technologies Corp. (Japan)


Published in SPIE Proceedings Vol. 5375:
Metrology, Inspection, and Process Control for Microlithography XVIII
Richard M. Silver, Editor(s)

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