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Proceedings Paper

Flare and its effects on imaging
Author(s): Stephen P. Renwick
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Paper Abstract

Flare continues to be a concern in the imaging performance of KrF and ArF scanners, both in new tools and in previous-generation tools used for non-critical layers. We have performed a systematic study of the effects of flare, parametrizing it in terms of its amplitude and range, and looking at modeled effects on different features. We have also collected flare data on newer and older scanners, and the modeling allows us to place those data in context and assess their impact on scanner performance. Results show that flare is not a big driver in scanner imaging.

Paper Details

Date Published: 28 May 2004
PDF: 9 pages
Proc. SPIE 5377, Optical Microlithography XVII, (28 May 2004); doi: 10.1117/12.535966
Show Author Affiliations
Stephen P. Renwick, Nikon Precision, Inc. (United States)

Published in SPIE Proceedings Vol. 5377:
Optical Microlithography XVII
Bruce W. Smith, Editor(s)

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