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Proceedings Paper

Reliability measure for segmenting algorithms
Author(s): Robert E. Alvarez
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Paper Abstract

Segmenting is a key initial step in many computer-aided detection (CAD) systems. Our purpose is to develop a method to estimate the reliability of segmenting algorithm results. We use a statistical shape model computed using principal component analysis. The model retains a small number of eigenvectors, or modes, that represent a large fraction of the variance. The residuals between the segmenting result and its projection into the space of retained modes are computed. The sum of the squares of residuals is transformed to a zero-mean, unit standard deviation Gaussian random variable. We also use the standardized scale parameter. The reliability measure is the probability that the transformed residuals and scale parameter are greater than the absolute value of the observed values. We tested the reliability measure with thirty chest x-ray images with “leave-out-one” testing. The Gaussian assumption was verified using normal probability plots. For each image, a statistical shape model was computed from the hand-digitized data of the rest of the images in the training set. The residuals and scale parameter with automated segment results for the image were used to compute the reliability measure in each case. The reliability measure was significantly lower for two images in the training set with unusual lung fields or processing errors. The data and Matlab scripts for reproducing the figures are at http://www.aprendtech.com/papers/relmsr.zip Errors detected by the new reliability measure can be used to adjust processing or warn the user.

Paper Details

Date Published: 4 May 2004
PDF: 8 pages
Proc. SPIE 5372, Medical Imaging 2004: Image Perception, Observer Performance, and Technology Assessment, (4 May 2004); doi: 10.1117/12.535542
Show Author Affiliations
Robert E. Alvarez, Aprend Technology (United States)


Published in SPIE Proceedings Vol. 5372:
Medical Imaging 2004: Image Perception, Observer Performance, and Technology Assessment
Dev P. Chakraborty; Miguel P. Eckstein, Editor(s)

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