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Proceedings Paper

Fourier crosstalk analysis of multislice and cone-beam helical CT
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Paper Abstract

Multi-slice helical CT scanners allow for much faster scanning and better x-ray utilization than do their single-slice predecessors, but they engender considerably more complicated data sampling patterns due to the interlacing of the samples from different rows as the patient is translated. Characterizing and optimizing this sampling is challenging because the conebeam geometry of such scanners means that the projections measured by each detector row are at least slightly oblique, making it difficult to apply standard multidimensional sampling analyses. In this study, we seek to apply a more general framework for analyzing sampled imaging systems known as Fourier crosstalk analysis. Our purpose in this preliminary work is to compare the information content of the data acquired in three different scanner geometries and operating conditions with ostensibly equivalent volume coverage and average longitudinal sampling interval: a single-slice scanner operating at pitch 1, a four-slice scanner operating at pitch 3 and a 15-slice scanner operating at pitch 15. We find that moving from a single-slice to a multi-slice geometry introduces longitudinal crosstalk characteristic of the longitudinal sampling interval between periods of individual each detector row, and not of the overall interlaced sampling pattern. This is attributed to data inconsistencies caused by the obliqueness of the projections in a multi-slice/conebeam configuration. However, these preliminary results suggest that the significance of this additional crosstalk actually decreases as the number of detector rows increases.

Paper Details

Date Published: 6 May 2004
PDF: 10 pages
Proc. SPIE 5368, Medical Imaging 2004: Physics of Medical Imaging, (6 May 2004); doi: 10.1117/12.534117
Show Author Affiliations
Patrick J. La Riviere, Univ. of Chicago (United States)


Published in SPIE Proceedings Vol. 5368:
Medical Imaging 2004: Physics of Medical Imaging
Martin J. Yaffe; Michael J. Flynn, Editor(s)

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