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Proceedings Paper

Optical properties of Er3+-doped fluoride glass channel waveguides
Author(s): Herve Haquin; Ion Vasilief; Gilles Fonteneau; Virginie Nazabal; Jean-Luc Adam; Stephan Guy; Bernard Jacquier; Maurice Couchaud; Maurice Rabarot; Laurent Fulbert
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Paper Abstract

The latest results on the preparation and characterization of Er3+-doped fluoride glass channel waveguides are presented. The waveguides are prepared by means of ion exchange between fluoride and chloride ions, through a silica mask, on ZBLA (ZrF4-BaF2-LaF3-AlF3) fluoride glass substrate. Single mode propagation is demonstrated at 1.55 μm for a 10-mm long, 5-μm wide waveguide. Propagation losses are found to be not greater than 0.28 dB/cm. An "on/off' gain of 3.9 dB is measured at the output of a 1% Er3+-4% Ce3+-doped fluoride waveguide, with about 240 mW incident pump power at 980 nm. Modelisation studies show that net gain could be achieved in (Er3+, Ce3+) doubly-doped and (Er3+, Ce3+, Yb3+) triply doped fluoride waveguides.

Paper Details

Date Published: 14 June 2004
PDF: 6 pages
Proc. SPIE 5350, Optical Components and Materials, (14 June 2004); doi: 10.1117/12.532846
Show Author Affiliations
Herve Haquin, Lab. Verres et Ceramiques, CNRS and Univ. de Rennes I (France)
Ion Vasilief, Lab. de Physico-Chimie des Materiaux Luminescents, CNRS and Univ. de Claude Bernard Lyon I (France)
Gilles Fonteneau, Lab. Verres et Ceramiques, CNRS and Univ. de Rennes I (France)
Virginie Nazabal, Lab. Verres et Ceramiques, CNRS and Univ. de Rennes I (France)
Jean-Luc Adam, Lab. Verres et Ceramiques, CNRS and Univ. de Rennes I (France)
Stephan Guy, Lab. de Physico-Chimie des Materiaux Luminescents, CNRS and Univ. de Claude Bernard Lyon I (France)
Bernard Jacquier, Lab. de Physico-Chimie des Materiaux Luminescents, CNRS and Univ. de Claude Bernard Lyon I (France)
Maurice Couchaud, CEA-LETI (France)
Maurice Rabarot, CEA-LETI (France)
Laurent Fulbert, CEA-LETI (France)


Published in SPIE Proceedings Vol. 5350:
Optical Components and Materials
Michel J. F. Digonnet; Shibin Jiang, Editor(s)

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