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Proceedings Paper

Multispectral infrared BRDF forward-scatter measurements of common black surface preparations and materials -- or "how black is black in the IR?"
Author(s): John Lester Miller
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Paper Abstract

Fundamental to the design of an infrared sensor is controlling the stray light and internal radiation emission. A series of Bi-directional Reflectance Distribution Function (BRDF) measurements at two infrared bandpasses in the MWIR and LWIR were acquired. Incident beams were oriented 10 and 60-degrees from normal. Forward-scatter (key to baffles and cold-shields) data is presented for infrared black surface preparations including: anodizing, copper oxide, nickel oxide, black paints, and trademarked black surfaces. Comparison is also made between selected surfaces before and after exposure to 78 Kelvin (LN2) thermal cycles. This paper also includes scanning electron microscope (SEM) images and discrete Fourier transform (DFT)) measurements for selected black surfaces, including comparisons of damaged and undamaged nickel oxide.

Paper Details

Date Published: 12 April 2004
PDF: 11 pages
Proc. SPIE 5405, Thermosense XXVI, (12 April 2004); doi: 10.1117/12.532620
Show Author Affiliations
John Lester Miller, FLIR Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 5405:
Thermosense XXVI
Douglas D. Burleigh; K. Elliott Cramer; G. Raymond Peacock, Editor(s)

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