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Proceedings Paper

Dual-layer phase-change recording media for system with NA of 0.65 and light incidence on 0.6-mm-thick substrate
Author(s): Takayuki Tsukamoto; T. Nakai; Sumio Ashida; Keiichiro Yusu; Katsutaro Ichihara; Noritake Ohmachi; Naoki Morishita; N. Yoshida; Naomasa Nakamura
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Paper Abstract

We have investigated the recording characteristics of the dual-layer phase change recording media for the sysetm with the NA of 0.65, the wavelength of 405 nm, and the light incidence on 0.6-mm-thick substrate having the land and groove format. For both L0 and L1 of the dual-layer disc, we have adopted bismuth substituted pseudo-binary GeSbTe alloy film as the recording layer and a novel interface layer material in order to improve overwriting characteristics. Bit error rate measurements have successfully demonstrated the feasibility of the user capacity of 36GB and confirmed 30GB with tilt margins.

Paper Details

Date Published: 16 September 2003
PDF: 6 pages
Proc. SPIE 5069, Optical Data Storage 2003, (16 September 2003); doi: 10.1117/12.532422
Show Author Affiliations
Takayuki Tsukamoto, Toshiba Corp. (Japan)
T. Nakai, Toshiba Corp. (Japan)
Sumio Ashida, Toshiba Corp. (Japan)
Keiichiro Yusu, Toshiba Corp. (Japan)
Katsutaro Ichihara, Toshiba Corp. (Japan)
Noritake Ohmachi, Toshiba Corp. (Japan)
Naoki Morishita, Toshiba Corp. (Japan)
N. Yoshida, Toshiba Corp. (Japan)
Naomasa Nakamura, Toshiba Corp. (Japan)


Published in SPIE Proceedings Vol. 5069:
Optical Data Storage 2003
Michael O'Neill; Naoyasu Miyagawa, Editor(s)

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