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Proceedings Paper

Multichannel boundary scan controller
Author(s): Wojciech M. Zabolotny; Seweryn Jodlowski; Michal Pietrusinski; Krzysztof T. Pozniak; Ignacy Maciej Kudla
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Paper Abstract

The paper presents, a specially designed chip, which ensures the carrying out of tests compliant with IEEE 1149.1-1990 Std. The above mentioned tests are very useful when checking for any errors and defects in electronics devices. The currently available solutions are not suitable for the requirements, which are quite specific and are the results of past experience. Therefore, a dedicated Field Programmable Gate Array (FPGA) core was created in VLSI Hardware Description Language (VHDL) implementing the desired functionality. The achieved result is a BS controller supporting many BS chains, working in parallel and using pipelining to boost performance.

Paper Details

Date Published: 24 October 2003
PDF: 5 pages
Proc. SPIE 5125, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments, (24 October 2003); doi: 10.1117/12.531564
Show Author Affiliations
Wojciech M. Zabolotny, Warsaw Univ. of Technology (Poland)
Seweryn Jodlowski, Warsaw Univ. of Technology (Poland)
Michal Pietrusinski, Warsaw Univ. (Poland)
Krzysztof T. Pozniak, Warsaw Univ. of Technology (Poland)
Ignacy Maciej Kudla, Warsaw Univ. (Poland)


Published in SPIE Proceedings Vol. 5125:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments

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