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Proceedings Paper

Field emission testing of carbon nanotubes for THz frequency vacuum microtube sources
Author(s): Harish Manohara; Wei Lien Dang; Peter H. Siegel; Michael Hoenk; Ali Husain; Axel Scherer
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Paper Abstract

A carbon nanotube-based high current density electron field emission source is under development at Jet Propulsion Laboratory (JPL) for submillimeter-wave power generation (300 GHz to 3 THz). This source is the basis for a novel vacuum microtube component: the nanoklystron. The nanoklystron is a monolithically fabricated reflex klystron with dimensions in the micrometer range. The goal is to operate this device at much lower voltages than would be required with hot-electron sources and at much higher frequencies than have ever been demonstrated. Both single-walled (SWNTs) as well as multi-walled nanotubes (MWNTs) are being tested as potential field-emission sources. This paper presents initial results and observations of these field emission tests. SWNTs and MWNTs were fabricated using standard CVD techniques. The tube density was higher in the case of MWNT samples. As previously reported, high-density samples suffered from enhanced screening effect thus decreasing their total electron emission. The highest emission currents were measured from disordered, less dense MWNTs and were found to be ~0.63 mA @ 3.6 V/μm (sample 1) and ~3.55 mA @ 6.25 V/μm (sample 2). The high density vertically aligned MWNTs showed low field emission as predicted: 0.31 mA @ 4.7 V/μm.

Paper Details

Date Published: 23 December 2003
PDF: 8 pages
Proc. SPIE 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III, (23 December 2003); doi: 10.1117/12.531403
Show Author Affiliations
Harish Manohara, Jet Propulsion Lab. (United States)
Wei Lien Dang, California Institute of Technology (United States)
Peter H. Siegel, Jet Propulsion Lab. (United States)
Michael Hoenk, Jet Propulsion Lab. (United States)
Ali Husain, California Institute of Technology (United States)
Axel Scherer, California Institute of Technology (United States)


Published in SPIE Proceedings Vol. 5343:
Reliability, Testing, and Characterization of MEMS/MOEMS III
Danelle M. Tanner; Rajeshuni Ramesham, Editor(s)

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