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Proceedings Paper

Modeling of ellipsometric parameters of a nonuniform film with arbitrary orientation of an optical axis
Author(s): Mikhail M. Karpuk
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Paper Abstract

A computer model of calculation of matrix of reflection and ellipsometric angles of singleaxid films with an optic axis varying direction only with a thickness of a film on anisotropic substrate is developed. It is determined that the largest modifications of ellipsometric angles Δ and ψ are exhibited near the Brewster's angle for the bound air-substrate. Numerical simulation the Langmuir-Blodget films is showed, that Δ-ψ dependence have a sight of a spiral curves with an intersections in a thickness, and with a rotation of a film about plane incidence.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.531219
Show Author Affiliations
Mikhail M. Karpuk, Technical Univ. of Koszalin (Poland)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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