Share Email Print
cover

Proceedings Paper

Coherence and far-field patterns measurements in laser systems
Author(s): Alvaro Bastidas; J. Munoz; Jaury Leon Tellez; Edith Rodriguez; Francisco J. Racedo N.
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the actuality the systems laser have become to the fundamental pillars of the science and the technology by their characteristic. In this work was development an specially system, versatile and compact, for obtain important physiques parameters in the characterization of laser device. The parameters obtained was the coherence grade, spatially temporary and, and the far field radiation patterns with their angles of divergence. The previous knowledge of these parameters is part of calibration of the laser system principally in high accuracy applications.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.531105
Show Author Affiliations
Alvaro Bastidas, Univ. del Cauca (Colombia)
J. Munoz, Univ. del Cauca (Colombia)
Jaury Leon Tellez, Univ. del Cauca (Colombia)
Edith Rodriguez, Univ. del Cauca (Colombia)
Francisco J. Racedo N., Univ. del Cauca (Colombia)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

© SPIE. Terms of Use
Back to Top