Share Email Print
cover

Proceedings Paper

Nonuniform sampling of coherence functions produced by incoherent 3-D sources
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A nonuniform sampling scheme for measuring the mutual intensity of the wavefield produced by an incoherent three-dimensional object is described. The scheme has application to imaging via coherence function measurements and to remote imaging via coherence function transfer. The nonuniform sampling grid is obtained through analysis of an extension of the van Cittert-Zernike relationship appropriate to spatially-limited three-dimensional objects. When compared to the uniform sampling case, a smaller number of measurements is required, and the minimum separation between measurement points is larger.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.531050
Show Author Affiliations
Jonathan C. James, Georgia Institute of Technology (United States)
Gisele Welch, Georgia Institute of Technology (United States)
William T. Rhodes, Georgia Tech Lorraine (France)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life

© SPIE. Terms of Use
Back to Top