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Proceedings Paper

Angle-resolved differential reflectance: technique for 0-90 degree incidence angle reflectance measurements
Author(s): Antonio Parretta; Pasqualino Maddalena; Pierpasquale Tortora
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Paper Abstract

A new method is presented for measurements of angle-resolved reflectance of a plane surface. The main innovation introduced by the method consists in allowing to carry out reflectance measurements from 0° to 90° of incidence angle. This was obtained by changing the technique of sample illumination: instead of illuminating a portion of the test surface, the entire test surface is illuminated by a collimated and uniform beam at any angle of incidence. To be applied, the method requires, besides measurement on the unknown sample, also measurements on two different standards of diffuse reflectance. The method is particularly suitable for the optical characterization of photovoltaic devices, generally exposed to the inclined light of the direct component of solar radiation.

Paper Details

Date Published: 19 November 2003
PDF: 3 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530968
Show Author Affiliations
Antonio Parretta, ENEA (Italy)
Pasqualino Maddalena, Univ. di Napoli Federico II (Italy)
Pierpasquale Tortora, Univ. of Neuchatel (Switzerland)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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