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Proceedings Paper

Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control
Author(s): Osami Sasaki; Kazuhiro Akiyama; Takamasa Suzuki
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Paper Abstract

Phase modulation amplitude Zb caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scanning becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer.

Paper Details

Date Published: 19 November 2003
PDF: 3 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530947
Show Author Affiliations
Osami Sasaki, Niigata Univ. (Japan)
Kazuhiro Akiyama, Niigata Univ. (Japan)
Takamasa Suzuki, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life

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