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Proceedings Paper

Optical characterization of materials in sol-gel dip coatings
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Paper Abstract

Optical properties of materials inside a multilayer stack may differ from those of single layers. This fact is specially noticeable in the case of sol-gel films obtained by dip coatings. We propose a method to determine the refractive index and thickness of materials inside a multilayer stack, based on the simultaneous characterization of several samples. The procedure increases the reliability of the results and helps in improving quality in optical coating production. (Summary only available)

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530760
Show Author Affiliations
Maria Cristina Ferrara, ENEA (Italy)
Saverio Mazzarelli, ENEA (Italy)
Jordi Sancho-Parramon, Univ. de Barcelona (Spain)
Salvador Bosch, Univ. de Barcelona (Spain)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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