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Proceedings Paper

Optimized performance of graded multilayer optics for x-ray single-crystal diffraction
Author(s): Carsten Michaelsen; Joerg Wiesmann; Christian Hoffmann; A. Oehr; A. B. Storm; L. J. Seijbel
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Paper Abstract

We present recent developments in the production of X-ray multilayer optics for Cu Kα laboratory single crystal diffraction equipment for protein crystallography and structural proteomics. The paper shows design, simulations and properties of Montel optics comprised of two elliptically bent focusing multilayers, optimized for the use with modern rotating anode X-ray generators. The multilayers are sputter deposited with a graded d-spacing along the length of the substrate. The various beam properties such as flux density and divergence are investigated in detail. After optimization of the optic for a state-of-the-art rotating anode x-ray generator, we obtain a flux density of 1 x 1010 photons/s/mm2. Results for a typical protein structure will be shown, illustrating the advantage of Montel optics in the field of single-crystal diffraction and protein crystallography for life sciences.

Paper Details

Date Published: 13 January 2004
PDF: 9 pages
Proc. SPIE 5193, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications, (13 January 2004); doi: 10.1117/12.530264
Show Author Affiliations
Carsten Michaelsen, Incoatec GmbH (Germany)
Joerg Wiesmann, Incoatec GmbH (Germany)
Christian Hoffmann, Incoatec GmbH (Germany)
A. Oehr, Incoatec GmbH (Germany)
A. B. Storm, Bruker Nonius B.V. (Netherlands)
L. J. Seijbel, Bruker Nonius B.V. (Netherlands)


Published in SPIE Proceedings Vol. 5193:
Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications
Ali M. Khounsary; Udo Dinger; Kazuya Ota, Editor(s)

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