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Proceedings Paper

Pseudo-exhaustive testing using t-distribution
Author(s): Kang Hyeon Rhee
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Paper Abstract

This paper presents a new pseudo-exhaustive testing algorithm that is composed of the path sensitization and sub-circuit partitioning using t-distribution. In the proposed testing algorithm, the paths, for the path sensitization the, between PIs and POs based on the high TMY (test-mainstay) nodes of CUT are sensitized and the boundary nodes, for the partitioned sub-circuits, are defined on the level of significance α on t-distribution respectively. As a consequence, when (1-α) is 0.2368, the most suitable of the performance to operate the singular cover and consistency operation in the path sensitization. And when the α is 0.5217, the most suitable of the performance to partition the sub-circuit in sub-circuit partitioning.

Paper Details

Date Published: 30 March 2004
PDF: 8 pages
Proc. SPIE 5274, Microelectronics: Design, Technology, and Packaging, (30 March 2004); doi: 10.1117/12.530135
Show Author Affiliations
Kang Hyeon Rhee, Chosun Univ. (South Korea)


Published in SPIE Proceedings Vol. 5274:
Microelectronics: Design, Technology, and Packaging
Derek Abbott; Kamran Eshraghian; Charles A. Musca; Dimitris Pavlidis; Neil Weste, Editor(s)

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