Share Email Print

Proceedings Paper

Single- and multiple-pulse laser-induced breakdown in transparent dielectrics in the femto-nanosecond region
Author(s): Oleg M. Efimov; Saurius Juodkazis; Hiroaki Misawa
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This review is devoted to a long-term investigation into the nature of the laser-induced damage of silciate glasses. As an important result, we show that the threshold power density of the intrinsic damage of the boro-silicate glass at ~1 μm wavelength does not depend on pulse duration from 2 x 10-13 to 3 x 10-8s as long as self-focusing is avoided. This result cannot be explained by existing theories and indicates that the damage mechanism involves a collective response of a certain volume in the dielectric as a whole, rather than the accumulation of electrons via individual generation processes like multiphoton, tunneling, or avalanche. Special attention in the research was paid to investigation into the processes of multiple pulse damage and subthreshold modification of boro- and lead-silicate glasses.

Paper Details

Date Published: 10 June 2004
PDF: 13 pages
Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); doi: 10.1117/12.530098
Show Author Affiliations
Oleg M. Efimov, HRL Labs. (United States)
Saurius Juodkazis, Univ. of Tokushima (Japan)
Hiroaki Misawa, Univ. of Tokushima (Japan)

Published in SPIE Proceedings Vol. 5273:
Laser-Induced Damage in Optical Materials: 2003
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top