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Proceedings Paper

Refractive index inhomogeneity measurement of a parallel plate in a Fizeau interferometer by a new wavelength scanning algorithm
Author(s): Kenichi Hibino; Bozenko F. Oreb; Philip S. Fairman
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Paper Abstract

Interferometric measurement of the refractive index inhomogeneity of a glass parallel plate has been demonstrated experimentally to a resolution of 10-6. Wavelength scanning interferometry allows the simultaneous measurement of optical thickness and surface shape of a parallel optical plate. A new sampling function suppresses the first-order refractive index dispersion and multiple-beam interference noise to give a measurement resolution of 2 nm in optical thickness.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530070
Show Author Affiliations
Kenichi Hibino, AIST (Japan)
Bozenko F. Oreb, CSIRO (Australia)
Philip S. Fairman, CSIRO (Australia)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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