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Proceedings Paper

Simultaneous measurements of thermal optical and linear thermal expansion coefficients of Ta2O5 films
Author(s): Mehmet Naci Inci
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Paper Abstract

An experimental determination technique for simultaneous measurements of the thermal optical and the linear thermal expansion coefficients of tantalum pentoxide thin films at infrared wavelength region is described. A tantalum pentoxide thin film deposited directly onto the end face of a single mode optical fiber was illuminated with a SLD source and its spectrum on reflection was monitored at various temperatures using an optical spectrum analyzer. Temperature induced change in the index of refraction and the film thickness were determined from the spectrum to calculate the thermal optical and the linear thermal expansion coefficients simultaneously.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.530051
Show Author Affiliations
Mehmet Naci Inci, Sabanci Univ. (Turkey)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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