Share Email Print
cover

Proceedings Paper

Integration of contrasting technologies into advanced optical security devices
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

OVP security pigment, the active ingredient in OVI security ink, is an assembly of high performance microscopic filters. The market acceptance of these filters has led them to become perhaps the most widely distributed interference devices on the planet. Recently, interference devices have been developed that provide the security industry with features beyond proven overt protection. New products are being launched that unite the attributes of optical interference with those of other technologies. One approach integrates thin film interference and diffractive interference to create a host of new security devices. The combined effects are complex and often surprising. The science behind the fusion is explored and the effects demonstrated. Interference pigment technology has also been combined with the science of magnetics to create a new line of OVP security pigments. To facilitate the practical use of such pigments, novel application technology has been developed which allows for the creation of new overt effects. This paper examines pigment designs and describes the physics behind the advanced application technology. The science of layering security features has long been demonstrated effective in deterring counterfeiting. Now it is possible to provide multiple layers of security within the same device through the integration of proven technologies.

Paper Details

Date Published: 3 June 2004
PDF: 13 pages
Proc. SPIE 5310, Optical Security and Counterfeit Deterrence Techniques V, (3 June 2004); doi: 10.1117/12.530039
Show Author Affiliations
Paul G. Coombs, Flex Products, Inc. (United States)
Alberto Argoitia, Flex Products, Inc. (United States)
Vladimir P. Raksha, Flex Products, Inc. (United States)
Roger W. Phillips, Flex Products, Inc. (United States)


Published in SPIE Proceedings Vol. 5310:
Optical Security and Counterfeit Deterrence Techniques V
Rudolf L. van Renesse, Editor(s)

© SPIE. Terms of Use
Back to Top