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Proceedings Paper

Error analysis and tolerance allocation for confocal scanning microscopy using the Monte Carlo method
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Paper Abstract

The errors can cause the serious loss of the performance of a precision machine system. In this paper, we propose the method of allocating the alignment tolerances of the components and apply this method to Confocal Scanning Microscopy (CSM) to get the optimal tolerances. CSM uses confocal aperture, which blocks the out-of-focus information. Thus, it provides images with superior resolution and has unique property of optical sectioning. Recently, due to these properties, it has been widely used for measurement in biological field, medical science, material science and semiconductor industry. In general, tight tolerances are required to maintain the performance of a system, but a high cost of manufacturing and assembling is required to preserve the tight tolerances. The purpose of allocating the optimal tolerances is minimizing the cost while keeping the performance of the system. In the optimal problem, we set the performance requirements as constraints and maximized the tolerances. The Monte Carlo Method, a statistical simulation method, is used in tolerance analysis. Alignment tolerances of optical components of the confocal scanning microscopy are optimized, to minimize the cost and to maintain the observation performance of the microscopy. We can also apply this method to the other precision machine system.

Paper Details

Date Published: 13 July 2004
PDF: 8 pages
Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); doi: 10.1117/12.529942
Show Author Affiliations
Hongki Yoo, Korea Advanced Institute of Science and Technology (South Korea)
Dong-Kyun Kang, Korea Advanced Institute of Science and Technology (South Korea)
SeungWoo Lee, Korea Advanced Institute of Science and Technology (South Korea)
Junhee Lee, Korea Advanced Institute of Science and Technology (South Korea)
Dae-Gab Gweon, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 5324:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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