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Proceedings Paper

Controlled light exposure microscopy (CLEM): an effective reduction of phototoxicity
Author(s): Erik M. Manders; Carel H. Van Oven; Ron A. Hoebe
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Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, ; doi: 10.1117/12.529896
Show Author Affiliations
Erik M. Manders, Univ. van Amsterdam (Netherlands)
Carel H. Van Oven, Univ. van Amsterdam (Netherlands)
Ron A. Hoebe, Univ. van Amsterdam (Netherlands)


Published in SPIE Proceedings Vol. 5324:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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