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Proceedings Paper

Design and performance evaluation of reflection confocal microscopy using acousto-optical deflector and slit detector
Author(s): SeugnWoo Lee; Dong-Kyun Kang; HongKi Yoo; Dae-Gab Gweon; Suk-Won Lee; Kwang-Soo Kim
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Paper Abstract

We describe the design and the implementation of reflection confocal scanning microscopy (CSM) using an acousto-optical deflector (AOD) for the fast horizontal scan and a galvanometer mirror (GM) for the slow vertical scan. In the beam scanning system it is important to maintain the lateral and the axial performance during scanning operation. We propose a simple method to design a scanning system using the finite ray tracing and the diffraction theory. We define a cost function which contains the effect of aberrations on the performance of microscopy. We construct the designed system and evaluate its performance. The OSLO simulation shows that the performances of CSM are not changed with deflection angle. So we conclude that the beam scanning system is properly designed. In addition, we propose an image formation method and show images obtained with the system.

Paper Details

Date Published: 13 July 2004
PDF: 7 pages
Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); doi: 10.1117/12.529884
Show Author Affiliations
SeugnWoo Lee, Korea Advanced Institute of Science and Technology (South Korea)
Dong-Kyun Kang, Korea Advanced Institute of Science and Technology (South Korea)
HongKi Yoo, Korea Advanced Institute of Science and Technology (South Korea)
Dae-Gab Gweon, Korea Advanced Institute of Science and Technology (South Korea)
Suk-Won Lee, Samsung Electronics Co., Ltd. (South Korea)
Kwang-Soo Kim, Samsung Electronics Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 5324:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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