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Proceedings Paper

Two- and three-dimensional near-field microscopy using scattering probes
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Paper Abstract

Scanning near-field optical microscopy (SNOM) has proven to be very powerful in terms of both resolution and efficiency. We report on new advances of this technique using metallic tips to scatter the optical field and induce dramatic field enhancements. We also present a new technique under development using multiple nanometric beads as scattering probes dispersed in the volume of the sample, rather than using a single tip. The bead positions are determined in three dimensions (3-D) with a precision better than the diffraction limit, making possible high-resolution 3-D imaging of hollow structures in relatively transparent materials.

Paper Details

Date Published: 16 June 2004
PDF: 8 pages
Proc. SPIE 5327, Plasmonics in Biology and Medicine, (16 June 2004); doi: 10.1117/12.529298
Show Author Affiliations
Gael Moneron, Lab. d'Optique Physique/Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)
Laurent Williame, Lab. d'Optique Physique/Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)
Arnaud Dubois, Lab. d'Optique Physique/Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)
Samuel Gresillon, Lab. d'Optique Physique/Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)
Albert Claude Boccara, Lab. d'Optique Physique/Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)


Published in SPIE Proceedings Vol. 5327:
Plasmonics in Biology and Medicine
Tuan Vo-Dinh; Zygmunt Gryczynski; Joseph R. Lakowicz, Editor(s)

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