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Proceedings Paper

Three-dimensional imagery using multiple nanometric probes
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Paper Abstract

We present a high-resolution imaging technique using nanometric beads as multiple scattering local probes. The positions of the beads are determined in three dimensions by white-light interference microscopy. The technique has been applied to study the deformation of gels under mechanical constraint. The location of Brownian moving beads has also been demonstrated with nanometer spatial precision and 10 μs acquisition time. High-resolution 3-D imaging of hollow structures explored by the beads in relatively transparent materials should be possible.

Paper Details

Date Published: 13 July 2004
PDF: 8 pages
Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); doi: 10.1117/12.529274
Show Author Affiliations
Gael Moneron, Ecole Superieure de Physique et de Chimie Industrielles (France)
Lab. d'Optique Physique/CNRS (France)
Arnaud Dubois, Ecole Superieure de Physique et de Chimie Industrielles (France)
Lab. d'Optique Physique/CNRS (France)
Albert-Claude Boccara, Ecole Superieure de Physique et de Chimie Industrielles (France)
Lab. d'Optique Physique/CNRS (France)


Published in SPIE Proceedings Vol. 5324:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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