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Proceedings Paper

Imaging with a scatter-probe near filed optical microscope
Author(s): Victor Ruiz-Cortes; Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez; Hector Manuel Escamilla
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Paper Abstract

Using a scanning near-field optical microscope with a metallic probe tip (Fig 1), we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.529214
Show Author Affiliations
Victor Ruiz-Cortes, Ctr. de Investigacion Cientifica y de Educacion (Mexico)
Saul Alonso Zavala Ortiz, Ctr. de Investigacion Cientifica y de Educacion (Mexico)
Pedro Negrete-Regagnon, Ctr. de Investigacion Cientifica y de Educacion (Mexico)
Eugenio R. Mendez, Ctr. de Investigacion Cientifica y de Educacion (Mexico)
Hector Manuel Escamilla, Ctr. de Investigacion Cientifica y de Educacion (Mexico)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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