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Proceedings Paper

Wide field, phase measuring confocal microscopy of small particles
Author(s): N. B. E. Sawyer; Stephen P. Morgan; Michael G. Somekh; Chung Wah See; B. Y. Shekunov; E. Astrakharchik
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Paper Abstract

Amplitude and phase measurements of small particles using a wide field, phase measuring confocal microscope are demonstrated. The wide field confocal capability of the microscope is achieved by illuminating both sample and reference arms of a Linnik interferometer with a moving speckle pattern. In addition a rigorous vector diffraction microscope model based upon Mie scattering theory has been developed. The model is particularly useful as by careful consideration of the scattered and unscattered light, quantitative transmission images can be achieved.

Paper Details

Date Published: 19 November 2003
PDF: 3 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.529191
Show Author Affiliations
N. B. E. Sawyer, Univ. of Nottingham (United Kingdom)
Stephen P. Morgan, Univ. of Nottingham (United Kingdom)
Michael G. Somekh, Univ. of Nottingham (United Kingdom)
Chung Wah See, Univ. of Nottingham (United Kingdom)
B. Y. Shekunov, Univ. of Bradford (United Kingdom)
E. Astrakharchik, Univ. of Bradford (United Kingdom)

Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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