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Proceedings Paper

Scanning total internal reflection fluorescence microscopy
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Paper Abstract

We report on a new form of total internal reflection fluorescence microscopy. Instead of using a prism, an objective of numerical aperture 1.65 is used under ring beam illumination. As a result, the propagating component of the illumination wave is suppressed and a focused evanescent spot is produced with strength of 20 times stronger than that in the prism. A near-field image is obtained by the scanning of a sample illuminated by the evanescent focal spot. The new imaging system has been successfully used for characterizing CdSe quantum dot nanoparticles and will be useful in nano-fabrication and single-molecular detection.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.529180
Show Author Affiliations
Min Gu, Swinburne Univ. of Technology (Australia)
James Won Min Chon, Swinburne Univ. of Technology (Australia)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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