Share Email Print
cover

Proceedings Paper

Object segmentation, quantification, counting, and tracking
Author(s): Asad A. Abu-Tarif; Vitaliy Khiznichenko; Brian Northan; Tim Holmes; Phillip Yoon; Jonathan Girroir; Paul Brathwaite
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A complete system for object segmentation, counting, quantification, and tracking from microscopic images was implemented. We found that image deconvolution and reconstruction operations are essential to the success of any general-purpose segmentation algorithm and hence are of paramount importance for a counting and tracking software system. Wavelet-based image enhancement, background equalization, and noise suppression routines are the components in our novel general-purpose segmentation algorithm. Simple object recognition based on averages and preset tolerances suffices for most applications. As expected, boundary smoothing is important if watershed-based blob separation is to be used. One of the challenges of a general-purpose counting and tracking system is the need for a large number of object quantification components (features). In tracking we found that incorporating weighted features into an error function improves the accuracy over just the path coherence criterion and that evaluating correspondences over multiple time frames improves the accuracy over using only two consecutive time frames.

Paper Details

Date Published: 13 July 2004
PDF: 9 pages
Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); doi: 10.1117/12.529117
Show Author Affiliations
Asad A. Abu-Tarif, AutoQuant Imaging, Inc. (United States)
Vitaliy Khiznichenko, AutoQuant Imaging, Inc. (United States)
Brian Northan, AutoQuant Imaging, Inc. (United States)
Tim Holmes, AutoQuant Imaging, Inc. (United States)
Rensselaer Polytechnic Institute (United States)
Phillip Yoon, AutoQuant Imaging, Inc. (United States)
Rensselaer Polytechnic Institute (United States)
Jonathan Girroir, AutoQuant Imaging, Inc. (United States)
Paul Brathwaite, AutoQuant Imaging, Inc. (United States)


Published in SPIE Proceedings Vol. 5324:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

© SPIE. Terms of Use
Back to Top