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Proceedings Paper

Refraction indexes of the polyester film 3M PP2500
Author(s): Mauricio Ortiz-Gutierrez; Marco Antonio Salgado V.; Aaron Moises Martinez-Basurto; Arturo Olivares-Perez; Jose Luis Juarez-Perez; Mario Perez-Cortes; Juan Carlos Ibarra-Torres
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Paper Abstract

In this work we describe an experimental technique to measure the refraction index of the 3M PP2500 film which has good behavior as quarter wave retarder plate for λ=633 nm. This technique is achieved when two perpendicular linearly polarized beam from a Wollaston prism are incident on the thickness of the film. The beams were incident parallel to the fast axis to measure the ordinary refraction index and parallel to the slow axis to measure the extraordinary refraction index. Some experimental results are shown.

Paper Details

Date Published: 25 June 2004
PDF: 4 pages
Proc. SPIE 5363, Emerging Optoelectronic Applications, (25 June 2004); doi: 10.1117/12.528078
Show Author Affiliations
Mauricio Ortiz-Gutierrez, Univ. Michoacana de San Nicolas de Hidalgo (Mexico)
Marco Antonio Salgado V., Univ. Michoacana de San Nicolas de Hidalgo (Mexico)
Aaron Moises Martinez-Basurto, Univ. Michoacana de San Nicolas de Hidalgo (Mexico)
Arturo Olivares-Perez, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Jose Luis Juarez-Perez, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Mario Perez-Cortes, Univ. Autonoma de Yucatan (Mexico)
Juan Carlos Ibarra-Torres, Ctr. de Ensenanza Tecnica Industrial (Mexico)


Published in SPIE Proceedings Vol. 5363:
Emerging Optoelectronic Applications
Ghassan E. Jabbour; Juha T. Rantala, Editor(s)

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