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Proceedings Paper

Lifetime studies of security inks using a novel gonio-spectrometer with in situ aging capability
Author(s): Markus Emerich; Erwin Rosenberg; Harald Deinhammer; Susanne Paleczek; Peter Fajmann; Daniel Schwarzbach
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Paper Abstract

The state of the art in manufacturing security documents includes the usage of a multitude of inks and pigments. The chemical and physical stability of these materials is a crucial point for their application in long lasting security products such as banknotes. For our studies regarding the bleaching characteristics of pigments and inks we have developed a highly integrated double beam gonio-spectrometer with in-situ ageing capability. The new spectrometer is equipped with a stabilized solar simulator lamp featuring a dosimeter, which is an advanced alternative to the commonly used blue wool scale. Additionally the sample temperature can be stabilized during ageing tests by a thermostatted sample holder. The instrument is capable of performing reflection measurements using monochromatic and polychromatic excitation and further allows fluorescence, phosphorescence and polarization measurements with high resolution over a wide wavelength range. We will present first results of defined ageing tests on a variety of security pigments and the setup of the newly developed spectrometer.

Paper Details

Date Published: 3 June 2004
PDF: 9 pages
Proc. SPIE 5310, Optical Security and Counterfeit Deterrence Techniques V, (3 June 2004); doi: 10.1117/12.527719
Show Author Affiliations
Markus Emerich, Technische Univ. Wien (Austria)
Erwin Rosenberg, Technische Univ. Wien (Austria)
Harald Deinhammer, Oesterrreichische Banknoten- und Sicherheitsdruck GmbH (Austria)
Susanne Paleczek, Oesterrreichische Banknoten- und Sicherheitsdruck GmbH (Austria)
Peter Fajmann, Oesterrreichische Banknoten- und Sicherheitsdruck GmbH (Austria)
Daniel Schwarzbach, Oesterrreichische Banknoten- und Sicherheitsdruck GmbH (Austria)


Published in SPIE Proceedings Vol. 5310:
Optical Security and Counterfeit Deterrence Techniques V
Rudolf L. van Renesse, Editor(s)

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