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Proceedings Paper

From low-level perception to high-level perception: a coherent approach for visual attention modeling
Author(s): Olivier Le Meur; Patrick Le Callet; Dominique Barba; Dominique Thoreau; Edouard Francois
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Paper Abstract

The saliency-based or bottom-up model of visual attention presented in this paper deals with still color images. The model we built is based on numerous properties of the human visual system (HVS), thus providing a biologically plausible system. The computation of early visual features such as color and orientation is a key step for any bottom-up model and the way to extract these visual features easily permits to differentiate a model from an other. The novelty of the proposed approach lies on the fact that the computation of early visual features is fully based on a HVS model consisting in projecting the picture into an opponent-colors space, applying a perceptual decomposition, contrast sensitivity and masking functions. Moreover, a strategy essentially based on a center surround mechanism and on the perceptual grouping phenomena underscores conspicuous locations by combining visual feature maps. A saliency map which is defined as a 2D topographic representation of conspicuity is then deduced. The model is applied to a number of natural images. Our results are then compared with the results of a well-know bottom-up model.

Paper Details

Date Published: 7 June 2004
PDF: 12 pages
Proc. SPIE 5292, Human Vision and Electronic Imaging IX, (7 June 2004); doi: 10.1117/12.527440
Show Author Affiliations
Olivier Le Meur, Thomson Multimedia R&D France (France)
Ecole Polytechnique de l'Univ. de Nantes (France)
Patrick Le Callet, IRCCyN, CNRS-Ecole Polytechnique de l'Univ. de Nantes (France)
Dominique Barba, IRCCyN, CNRS-Ecole Polytechnique de l'Univ. de Nantes (France)
Dominique Thoreau, Thomson Multimedia R&D France (France)
Edouard Francois, Thomson Multimedia R&D France (France)

Published in SPIE Proceedings Vol. 5292:
Human Vision and Electronic Imaging IX
Bernice E. Rogowitz; Thrasyvoulos N. Pappas, Editor(s)

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