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Proceedings Paper

Projection display metrology at NIST: measurements and diagnostics
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Paper Abstract

With the advent of digital cinema, medical imaging, and other applications, the need to properly characterize projection display systems has become increasingly more crucial. Several standards organizations have developed or are presently developing measurement procedures (including ANSI, IEC, ISO, VESA, and SMPTE). The National Institute of Standards and Technology (NIST) has played an important role by evaluating standards and procedures, developing diagnostics, and providing technical and editorial input, especially where unbiased technical expertise is needed to establish credibility and to investigate measurement problems.

Paper Details

Date Published: 28 May 2004
PDF: 12 pages
Proc. SPIE 5289, Liquid Crystal Materials, Devices, and Applications X and Projection Displays X, (28 May 2004); doi: 10.1117/12.527093
Show Author Affiliations
Paul A Boynton, National Institute of Standards and Technology (United States)
Edward F. Kelley, National Institute of Standards and Technology (United States)
John M. Libert, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 5289:
Liquid Crystal Materials, Devices, and Applications X and Projection Displays X
Ming Hsien Wu; Liang-Chy Chien, Editor(s)

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