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Proceedings Paper

Confocal microscopy for the testing of integrated optical devices
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Paper Abstract

Planar waveguides have been realized in lithium fluoride crystals by ion-beam irradiation. Ion bombardment produces color centers in the LiF crystal, increasing locally the refractive index. Confocal microscopy is applied to the characterization of the waveguides in order to assess the uniformity and distribution of color centers through the measurement of the photoluminescence emission.

Paper Details

Date Published: 19 November 2003
PDF: 3 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.527040
Show Author Affiliations
Franco Quercioli, Istituto Nazionale di Ottica Applicata (Italy)
Bruno Tiribilli, Istituto Nazionale di Ottica Applicata (Italy)
Massimo Vassalli, Istituto Nazionale di Ottica Applicata (Italy)
A. Ghirelli, Istituto Nazionale di Ottica Applicata (Italy)
Giancarlo C. Righini, Istituto di Fisica Applicata Nello Carrara (Italy)
Stefano Pelli, Istituto di Fisica Applicata Nello Carrara (Italy)
Marco Cremona, Pontificia Univ. Catolica do Rio de Janeiro (Brazil)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life

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