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Proceedings Paper

Competitive dynamics and pattern formation in a large array of optoelectronic feedback circuit system
Author(s): Adrienne J. Raglin; Mohamed F. Chouikha
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Paper Abstract

In artificial neural networks (ANN) individual nodes are used as processing units that perform simple computations. The computations can be performed based on unsupervised or supervised learning schemes. One type of learning scheme is a competitive unsupervised approach. In the competitive approach different nodes compete to become the "winner(s)", representing the highest activity level. In a large array opto-electronic system the competitive dynamics is not restricted to single elements but is some specially distributed structure. This interaction is typical for partially distributed nonlinear systems with complex behavior but may be unusual behavior in other systems with large arrays of elements for example some ANN. With an opto-electronic system it may be possible to consider new dynamics and more complex behavior for systems with large arrays. A different approach for parallel high resolution information processing that potentially goes beyond processing large numbers of neurons or elements is considered. NN has been successful in processing low-resolution images. Hopefully opto-electronic systems can generate similar mechanisms seen in NN such as cooperation and competition. Perhaps different self-organizing structures or patterns generated by these systems have some features similar to competition and cooperation. These types of structure or pattern interactions can be possible building blocks for more robust computational processes.

Paper Details

Date Published: 28 May 2004
PDF: 13 pages
Proc. SPIE 5298, Image Processing: Algorithms and Systems III, (28 May 2004); doi: 10.1117/12.527011
Show Author Affiliations
Adrienne J. Raglin, Army Research Lab. (United States)
Mohamed F. Chouikha, Howard Univ. (United States)


Published in SPIE Proceedings Vol. 5298:
Image Processing: Algorithms and Systems III
Edward R. Dougherty; Jaakko T. Astola; Karen O. Egiazarian, Editor(s)

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