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Proceedings Paper

Fractal properties of rough surfaces
Author(s): Oleg V. Angelsky; Dimitry N. Burkovets; Alexander V. Kovalchuk; Steen Gruner Hanson
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Paper Abstract

The multifractal description of rough surfaces is discussed and the mechanisms for analysis of fractal and multifractal height distributions of inhomogeneities for rough surfaces are simulated. The original technique for estimating the spectrum of singularities is proposed for studying these distributions. Further, the application of the wavelet analysis for quantitative characterization of fractal distributions associated with rough surfaces and for determination of the position of singularities of these structures is presented.

Paper Details

Date Published: 19 November 2003
PDF: 3 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.526960
Show Author Affiliations
Oleg V. Angelsky, Chernivtsy Univ. (Ukraine)
Dimitry N. Burkovets, Chernivtsy Univ. (Ukraine)
Alexander V. Kovalchuk, Chernivtsy Univ. (Ukraine)
Steen Gruner Hanson, Risoe National Lab. (Denmark)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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