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Proceedings Paper

Variable optical attenuator realized on silicon V-groove for optical beamforming networks
Author(s): Hayattin Yilmaz; Andreas Breuel; Wolfgang Vogel; Manfred Berroth
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Paper Abstract

We report in this paper the principal function of the electrically controlled variable optical attenuator (VOA) using polymer dispersed liquid crystal (PDLC) and describe the fabrication procedure on silicon v-groove. We have fabricated three VOA with a pitch of 2 mm on a single silicion v-groove chip with total dimensions of 12 mm x 10 mm. We have achieved a cell-dependent contrast ratio from 8 dB to 14 dB by applying a control voltage URMS (squared wave voltage, f = 10 kHz) from 0 to 30 V. We measured also a cell-dependent polarization dependent loss (PDL): < 3.6 dB for two cells and < 1.6 dB for one cell depending on the control voltage. The strong variation of the PDL and contrast ratio is due to the non-optimized PDLC processing parameters. Due to the large pitch size there is no crosstalk. The estimated power consumption is very low (< 1 μW), so the described fabrication procedure meets the requirements low cost, small power consumption and compact size. We have used this three VOA and proper chosen delay lines to build up a liquid crystal phase shifter (LCPS) for optically generated RF-signals at fRF = 2 GHz. Using the vector sum of two signals a continuously 360° phase shift of the RF-signal is demonstrated. We will present the theory and measurement results of 360° phase shifting. This LCPS can be used to control individually the phase and amplitude of each antenna element.

Paper Details

Date Published: 10 June 2004
PDF: 9 pages
Proc. SPIE 5358, Photonics Packaging and Integration IV, (10 June 2004); doi: 10.1117/12.526488
Show Author Affiliations
Hayattin Yilmaz, Univ. Stuttgart (Germany)
Andreas Breuel, Univ. Stuttgart (Germany)
Wolfgang Vogel, Univ. Stuttgart (Germany)
Manfred Berroth, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 5358:
Photonics Packaging and Integration IV
Randy A. Heyler; Ray T. Chen, Editor(s)

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