Share Email Print
cover

Proceedings Paper

Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors
Author(s): Arnold W Yanof; Karen E. Jachimowicz
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This work characterizes three different types of sensor defects, and investigates the applicability of the Contrast Threshold Function (CTF) of the human visual system to the manufacturing test criteria for CMOS image sensors. The sensor defect types characterized are resist streaking, dye color spots, and orange-peel photodiode sensitivity noise. Algorithms are presented to objectively identify and rate the severity of each. Visual evaluations determined the subjective level of detectability and objectionability of each. The spatial frequency and modulation of the defects were measured, and compared with an appropriate CTF. The result is the minimum defect levels noticeable in test images can be almost order-of-magnitude higher than the known CTFs determined for the limits of human visual system sensitivity.

Paper Details

Date Published: 7 June 2004
PDF: 9 pages
Proc. SPIE 5301, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V, (7 June 2004); doi: 10.1117/12.525756
Show Author Affiliations
Arnold W Yanof, Motorola (United States)
Karen E. Jachimowicz, Motorola (United States)


Published in SPIE Proceedings Vol. 5301:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V
Nitin Sampat; Morley M. Blouke; Ricardo J. Motta, Editor(s)

© SPIE. Terms of Use
Back to Top