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Proceedings Paper

Separation of bulk lifetime and surface recombination velocity by multi-wavelength technique
Author(s): Luigi Sirleto; Andrea Irace; Gianpaolo F. Vitale; Luigi Zeni; Antonello Cutolo
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Paper Abstract

In this paper a contactless, all-optical and non-destructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity is presented. The principle is based upon measurement, at low injection level, of the free carrier optical absorption transient probed by an infrared beam following electron-hole pair excitation by a pulsed laser beam working at several wavelengths. Being contactless and non-destructive with respect to the surface to be analyzed, the method is appealing for routine lifetime characterization.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.525491
Show Author Affiliations
Luigi Sirleto, Istituto di Ricerca per l'Elettromagnetismo e i Componenti Elettronici (Italy)
Andrea Irace, Univ. degli Studi di Napoli Federico II (Italy)
Gianpaolo F. Vitale, Univ. degli Studi di Napoli Federico II (Italy)
Luigi Zeni, Seconda Univ. degli Studi di Napoli (Italy)
Antonello Cutolo, Univ. degli Studi di Sannio (Italy)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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