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Proceedings Paper

Surface investigation of VUV-optical components after exposure to high-energy synchrotron radiation
Author(s): Stefan Guenster; Holger Blaschke; Kai Starke; Detlev Ristau; Miltcho B. Danailov; B. Diviacco; Alexandre Gatto; Norbert Kaiser; Francesca Sarto; Enrico Massetti
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Paper Abstract

In the framework of the European research project EUFELE, a set of fluoride and oxide single layer coatings was deposited, irradiated with synchrotron radiation, and subsequently thoroughly characterised. The observed coating damage is strongly related to the spatial distribution of the synchrotron radiation. Therefore, characterisation methods have to be adapted to techniques that are capable to reveal the structural and optical behavior with adequate spatial resolution. A summary of the radiation damages of oxide materials (SiO2, Al2O3 and HfO2) produced by conventional and sputter deposition techniques, and of fluoride single layers (MgF2, LaF3, AlF3) deposited by thermal evaporation is presented. Degradation was observed within the irradiated areas as well as in the not directly exposed area. The observed degradation effects depend on the surface site. Oxide systems show a superior resistance compared to fluoride coatings. The most sensitive material is Lanthanum fluoride.

Paper Details

Date Published: 10 June 2004
PDF: 7 pages
Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); doi: 10.1117/12.525490
Show Author Affiliations
Stefan Guenster, Laser Zentrum Hannover e.V. (Germany)
Holger Blaschke, Laser Zentrum Hannover e.V. (Germany)
Kai Starke, Laser Zentrum Hannover e.V. (Germany)
Detlev Ristau, Laser Zentrum Hannover e.V. (Germany)
Miltcho B. Danailov, Syncrotrone Trieste (Italy)
B. Diviacco, Syncrotrone Trieste (Italy)
Alexandre Gatto, Fraunhofer-Institut fur Angewandte Optik und Feinmechanik (Germany)
Norbert Kaiser, Fraunhofer-Institut fur Angewandte Optik und Feinmechanik (Germany)
Francesca Sarto, ENEA (Italy)
Enrico Massetti, ENEA (Italy)

Published in SPIE Proceedings Vol. 5273:
Laser-Induced Damage in Optical Materials: 2003
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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