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Proceedings Paper

Variable resolution profilometer for artwork surface topography
Author(s): Giuseppe Schirripa Spagnolo; Raffaele Majo; Dario Ambrosini; Domenica Paoletti
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Paper Abstract

We propose an optical method to evaluate deterioration mechanisms affecting cultural heritage materials. The method is based on a phase element, which forms interference fringes on the object. The surface topography is obtained by a phase shifting technique.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524910
Show Author Affiliations
Giuseppe Schirripa Spagnolo, Univ. degli Studi di Roma Tre (Italy)
Raffaele Majo, Univ. degli Studi di Roma Tre (Italy)
Dario Ambrosini, Univ. degli Studi di L'Aquila (Italy)
Domenica Paoletti, Univ. degli Studi di L'Aquila (Italy)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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