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Proceedings Paper

Photothermal microscopy for the study of laser damage initiation by measurement of absorption modification of silica seeded with gold nanoparticles
Author(s): Annelise During; Bertrand Bertussi; Mireille Commandre; Jean-Yves Natoli; Florian E. Bonneau; Patrick Combis; Jean-Luc Rullier; Emmanuel Cottancin; Michel Pellarin
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Paper Abstract

In order to understand the mechanisms of laser damage initiation, we study “model” samples constituted of pure silica seeded with 3 nm gold particles. Numerical simulations are performed with a 1-D hydrodynamic code to determine the laser light absorption by a spherical nanoparticle. This code also simulates the thermal conduction, radiative transfer and ionization by UV light emitted by the heated metallic particles. The setup used for experimental studies is a high resolution, high sensitivity photothermal microscope. This setup allows correlation between optical absorption and laser irradiation. We observe the silica transformation in terms of absorption modification as a function of the irradiation fluence. The morphology of irradiated samples surface is observed thanks to “Nomarski” and “atomic force” microscopy and compared to photothermal microscopy results. A correlation is observed between flaked silica and strongly absorbing areas.

Paper Details

Date Published: 10 June 2004
PDF: 7 pages
Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); doi: 10.1117/12.524856
Show Author Affiliations
Annelise During, Institut Fresnel (France)
Bertrand Bertussi, Institut Fresnel (France)
Mireille Commandre, Institut Fresnel (France)
Jean-Yves Natoli, Institut Fresnel (France)
Florian E. Bonneau, CEA-DAM Ile de France (France)
Patrick Combis, CEA-DAM Ile de France (France)
Jean-Luc Rullier, CEA-DAM Ile de France (France)
Emmanuel Cottancin, Univ. Claude Bernard Lyon I (France)
CNRS (France)
Michel Pellarin, Univ. Claude Bernard Lyon I (France)
CNRS (France)

Published in SPIE Proceedings Vol. 5273:
Laser-Induced Damage in Optical Materials: 2003
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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