Share Email Print
cover

Proceedings Paper

Self-focusing and surface damage in fused-silica windows of variable thickness with UV nanosecond pulses
Author(s): Herve Bercegol; Alain C. L. Boscheron; C. Lepage; Elizabeth Mazataud; Thierry Donval; Laurent Lamaignère; Marc Loiseau; Gerard Raze; Caroline Sudre
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Variable experimental conditions were used to measure the occurrence of front surface, rear surface and filamentation damage in synthetic fused silica windows. Experiments were performed at 355 nm with a table-top beam of mm-size, and at 351 nm with ALISE laser, a 100 J installation. The 351 nm beam was about 3 cm wide at the entrance surface; it was single-mode temporally, with or without a frequency modulation which has the function of widening the spectrum to decrease Stimulated Brillouin Scattering. The 355 nm was single-mode temporally. Thin windows showed very scarce front damage and no filament damage at intensities which cause a high density of rear surface damage. Without any spectral widening, the thicker windows (4.3 cm) showed appreciable amount of front surface damage; filaments were observed and but no filaments. When a spectral modulation was added, front surface damage vanished, filaments and rear surface damage were observed.

Paper Details

Date Published: 10 June 2004
PDF: 9 pages
Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); doi: 10.1117/12.524841
Show Author Affiliations
Herve Bercegol, CEA-CESTA (France)
Alain C. L. Boscheron, CEA-CESTA (France)
C. Lepage, CEA-CESTA (France)
Elizabeth Mazataud, CEA-CESTA (France)
Thierry Donval, CEA-CESTA (France)
Laurent Lamaignère, CEA-CESTA (France)
Marc Loiseau, CEA-CESTA (France)
Gerard Raze, CEA-CESTA (France)
Caroline Sudre, CEA-CESTA (France)


Published in SPIE Proceedings Vol. 5273:
Laser-Induced Damage in Optical Materials: 2003
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top