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Proceedings Paper

Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films
Author(s): Marcelo Barbalho Pereira; Flavio Horowitz
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Paper Abstract

As a complement to the standard m-line method, where an analytical curve is fitted to the measurements of waveguide modes and extrapolated to provide the refractive index in the zero-depth limit, we review our polarimetric approach to a direct-near surface measurement of graded-index films, and present its new and more straightforward version, which is applicable to existing samples without masking procedures prior to ion exchange.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524576
Show Author Affiliations
Marcelo Barbalho Pereira, Univ. Federal do Rio Grande do Sul (Brazil)
Flavio Horowitz, Univ. Federal do Rio Grande do Sul (Brazil)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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