Share Email Print

Proceedings Paper

Size and complex index of nanocenters: optical measurements
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Non destructive detection, localization and characterization of nanocenters today remains a challenge for investigation of laser-induced damage in optical materials. In this study we propose an attempt to reach this aim via optical techniques, and extract size and complex index of nanocenters. The procedure is described and results are given for SiO2 thin film samples. All conclusions are discussed in regard to assumptions.

Paper Details

Date Published: 10 June 2004
PDF: 9 pages
Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); doi: 10.1117/12.524397
Show Author Affiliations
Laurent Gallais, Institut Fresnel (France)
Philippe Voarino, Institut Fresnel (France)
Jean-Yves Natoli, Institut Fresnel (France)
Mireille Commandre, Institut Fresnel (France)
Claude Amra, Institut Fresnel (France)

Published in SPIE Proceedings Vol. 5273:
Laser-Induced Damage in Optical Materials: 2003
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top