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Proceedings Paper

Hidden grids, moire patterns, and 3D metrology
Author(s): Pablo F. Meilan; Anibal P. Laquidara; Mario Garavaglia
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Paper Abstract

Operations with optoelectronic hidden grid moire patterns to measure the distance from the camera to the object being observed were described in a recent paper. Now, in this paper, the possibility to make 3D metrological teleoperations based on hidden grids moire patterns is discussed.

Paper Details

Date Published: 19 November 2003
PDF: 2 pages
Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); doi: 10.1117/12.524147
Show Author Affiliations
Pablo F. Meilan, Univ. Nacional de La Plata (Argentina)
Anibal P. Laquidara, Univ. Nacional de La Plata (Argentina)
Mario Garavaglia, Univ. Nacional de La Plata (Argentina)


Published in SPIE Proceedings Vol. 4829:
19th Congress of the International Commission for Optics: Optics for the Quality of Life
Giancarlo C. Righini; Anna Consortini, Editor(s)

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