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Proceedings Paper

Industrial-camera-based high-power YAG beam profiler
Author(s): Lawrence I. Green
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Paper Abstract

The increased use of high power Semiconductor lasers for industrial applications has created a demand for accurate, detailed beam profiling devices. Current technology, however, limits the use of conventional beam profiling instruments to about 1.5 kW. We will discuss a novel method of profiling high power YAG (1064 nm) industrial lasers up to 4kW in average power and 30 mm in raw beam diameter, using a camera-based, computer operated beam-profiling device. The new instrument is portable and employs conventional optics to attenuate and reduce the raw beam, and is designed to be used in an industrial environment.

Paper Details

Date Published: 1 June 2004
PDF: 6 pages
Proc. SPIE 5333, Laser Resonators and Beam Control VII, (1 June 2004); doi: 10.1117/12.524026
Show Author Affiliations
Lawrence I. Green, Spiricon, Inc. (United States)


Published in SPIE Proceedings Vol. 5333:
Laser Resonators and Beam Control VII
Alexis V. Kudryashov, Editor(s)

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