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Proceedings Paper

The influences of injection and recombination on the EL efficiency in organic single-layer EL devices
Author(s): Chu-jun Zhao; Hongjian Li; Hao-yang Cui; Xue-mei Xu; Shu Qu; Jingcui Peng
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Paper Abstract

We have developed an analytical model to calculate the EL profile at high electric field in single layer structure, taking into account the charge injection process at each electrode, fission and recombination of polaron-excitons. By simulation, the influences of injection barriers on EL efficiency and fission distance on recombination efficiency are thoroughly studied. Using either both ohmic contacts or using an ohmic contact to inject the low mobility carrier and a contact limited contact to inject the high mobility carrier can obtain efficient devices. By comparison of the theoretical results with the experimental data reported in the literature, we found this model can reasonably elucidates the influences of some factors on injection and recombination.

Paper Details

Date Published: 12 May 2004
PDF: 10 pages
Proc. SPIE 5280, Materials, Active Devices, and Optical Amplifiers, (12 May 2004); doi: 10.1117/12.523025
Show Author Affiliations
Chu-jun Zhao, Hunan Univ. (China)
Hongjian Li, Hunan Univ. (China)
Hao-yang Cui, Hunan Univ. (China)
Xue-mei Xu, Hunan Univ. (China)
Central South Univ. (China)
Shu Qu, Hunan Univ. (China)
Jingcui Peng, Hunan Univ. (China)


Published in SPIE Proceedings Vol. 5280:
Materials, Active Devices, and Optical Amplifiers
Connie J. Chang-Hasnain; Dexiu Huang; Yoshiaki Nakano; Xiaomin Ren, Editor(s)

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