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Proceedings Paper

Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs
Author(s): Guonan Zhao; Jianping Hu; Fuhong Zhang; Linbin Cheng
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Paper Abstract

A fast and efficient method for element-identification and Analog-DfT with the aid of ac Josephson voltages has been found from several papers listed in our references where specified terms Novel-Optimum-Identification (NOI) and Fast-Convergence-Identification (FCI) have been emphasized. Not only those issues in our DCS, the Controllability and Observability, but also the hazard-proof abilities vs the parasitic stray capacitive coupling anywhere especially inside each device in analog interface circuits have to be taken into consideration for our analog-DfT requirement. A computer program based on the method has been made and tested for its efficiency and capability.

Paper Details

Date Published: 2 September 2003
PDF: 4 pages
Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.521989
Show Author Affiliations
Guonan Zhao, Hangzhou Univ. of Electronic Science and Technology (China)
Jianping Hu, Hangzhou Univ. of Electronic Science and Technology (China)
Fuhong Zhang, Hangzhou Univ. of Electronic Science and Technology (China)
Linbin Cheng, China Institute of Metrology (China)


Published in SPIE Proceedings Vol. 5253:
Fifth International Symposium on Instrumentation and Control Technology
Guangjun Zhang; Huijie Zhao; Zhongyu Wang, Editor(s)

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